JPH0372376U - - Google Patents

Info

Publication number
JPH0372376U
JPH0372376U JP13458889U JP13458889U JPH0372376U JP H0372376 U JPH0372376 U JP H0372376U JP 13458889 U JP13458889 U JP 13458889U JP 13458889 U JP13458889 U JP 13458889U JP H0372376 U JPH0372376 U JP H0372376U
Authority
JP
Japan
Prior art keywords
heat
case
insulating
case body
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13458889U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0738868Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989134588U priority Critical patent/JPH0738868Y2/ja
Publication of JPH0372376U publication Critical patent/JPH0372376U/ja
Application granted granted Critical
Publication of JPH0738868Y2 publication Critical patent/JPH0738868Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1989134588U 1989-11-20 1989-11-20 Ｉｃの温度試験用断熱ケース Expired - Fee Related JPH0738868Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989134588U JPH0738868Y2 (ja) 1989-11-20 1989-11-20 Ｉｃの温度試験用断熱ケース

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989134588U JPH0738868Y2 (ja) 1989-11-20 1989-11-20 Ｉｃの温度試験用断熱ケース

Publications (2)

Publication Number Publication Date
JPH0372376U true JPH0372376U (en]) 1991-07-22
JPH0738868Y2 JPH0738868Y2 (ja) 1995-09-06

Family

ID=31681914

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989134588U Expired - Fee Related JPH0738868Y2 (ja) 1989-11-20 1989-11-20 Ｉｃの温度試験用断熱ケース

Country Status (1)

Country Link
JP (1) JPH0738868Y2 (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009097968A (ja) * 2007-10-16 2009-05-07 Akim Kk 温度特性計測装置および温度特性計測方法
JP2013130423A (ja) * 2011-12-20 2013-07-04 Sharp Corp バーンイン装置
WO2020188792A1 (ja) * 2019-03-20 2020-09-24 日新ネオ株式会社 電子部品試験装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5619767U (en]) * 1979-07-24 1981-02-21
JPS63115074A (ja) * 1986-10-31 1988-05-19 Mitsubishi Electric Corp 半導体高温加速試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5619767U (en]) * 1979-07-24 1981-02-21
JPS63115074A (ja) * 1986-10-31 1988-05-19 Mitsubishi Electric Corp 半導体高温加速試験装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009097968A (ja) * 2007-10-16 2009-05-07 Akim Kk 温度特性計測装置および温度特性計測方法
JP2013130423A (ja) * 2011-12-20 2013-07-04 Sharp Corp バーンイン装置
WO2020188792A1 (ja) * 2019-03-20 2020-09-24 日新ネオ株式会社 電子部品試験装置
WO2020188844A1 (ja) * 2019-03-20 2020-09-24 日新ネオ株式会社 電子部品試験装置

Also Published As

Publication number Publication date
JPH0738868Y2 (ja) 1995-09-06

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Legal Events

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LAPS Cancellation because of no payment of annual fees